journal article·1991-02

Variations of interlayer structure in Cu x S/CdS bilayer thin film with annealing of CdS: an ellipsometric study

K P Vijayakumar

Bulletin of Materials Science· Volume 14· Issue 1
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Semiconductor materials and interfaces · Chalcogenide Semiconductor Thin Films · Optical Coatings and Gratings

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References (21)

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