journal article·1981-07

Lattice imaging studies on the structure and non-random disorder in SiC crystals

S R Singh, G Singh

Bulletin of Materials Science· Volume 3· Issue 2
Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Silicon Carbide Semiconductor Technologies · Electron and X-Ray Spectroscopy Techniques · Microstructure and mechanical properties

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References (17)

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