journal article·1999-05

Characterization of thin films using heavy ion beams

H Timmers, R G Elliman, T R Ophel

Bulletin of Materials Science· Volume 22· Issue 3
Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Ion-surface interactions and analysis · Metal and Thin Film Mechanics · Diamond and Carbon-based Materials Research

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References (9)

Show source-provided references
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3. Doyle B L and Peercy P S 1979Appl. Phys. Lett. 34 81110.1063/1.90654 ↗
4. Jarvis R Aet al 1996Electron. Lett. 32 55010.1049/el:19960314 ↗
5. Mitchell I V 1998 (private communication)
6. Ophel T R and Mitchell I V 1995Proceedings of the Australian conference on nuclear techniques of analysis (Sydney: Australian Institute of Nuclear Science and Engineering) p. 80
7. Ophel T R, Timmers H and Elliman R G 1999Nucl. Instrum. Meth. A423 38110.1016/S0168-9002(98)01408-9 ↗
8. Rouessac V 1998 (private communication)
9. Timmers Het al 1998Nucl. Instrum. Meth. B136–138 61110.1016/S0168-583X(97)00811-2 ↗