X-ray diffraction study of epitaxial zinc and cadmium films prepared by hot-wall technique
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Abstract
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Research context
OpenAlex topics: Copper Interconnects and Reliability · Surface and Thin Film Phenomena · Optical Coatings and Gratings
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References (4)
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1. Bandopadhyay S K and Pal A K 1979J. Mater. Sci. 14 298910.1007/BF00611484 ↗
2. Chopra K L 1969 Thin-film phenomena (New York: McGraw-Hill) 226
3. Kulkarni A V, Bose S and Pratap R 1984Thin Solid Films 120 L73-L7710.1016/0040-6090(84)90177-9 ↗
4. Nandi R K, Suchitra Sen and Sen-Gupta P 1978Thin Solid Films 51 14110.1016/0040-6090(78)90348-6 ↗