High resistivity In-doped ZnTe: electrical and optical properties
Source abstract
Abstract
Semi-insulating ZnTe prepared by In doping during Bridgman growth was found to have a resistivity of 5 ·74 × 10 7 ohm-cm, the highest reported so far in ZnTe, with hole concentration of 2 ·4 × 10 9 /cm 3 and hole mobility of 46 cm 2 /V·s at 300 K. The optical band gap was 2·06 eV at 293 K compared with 2·26 eV for undoped semiconducting ZnTe. Thermally stimulated current (TSC) studies revealed 2 trap levels at depths of 202 -222 meV and 412-419 meV, respectively. Photoluminescence (PL) studies at 10 K showed strong peaks at 1 ·37 eV and 1·03 eV with a weak shoulder at 1 ·43 eV. Short anneal for 3 min at 250°C led to conversion to a p-type material with resistivity, 14 ·5 ohm -cm, indicating metastable behaviour. Raman studies carried out on undoped and In-doped samples showed small but significant differences. Possible models for semi-insulating behaviour and meta-stability are proposed.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Advanced Semiconductor Detectors and Materials · Semiconductor Quantum Structures and Devices · Chalcogenide Semiconductor Thin Films
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (15)
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