p-AgCoO2/n-ZnO heterojunction diode grown by rf magnetron sputtering
Source abstract
Abstract
P-type transparent semiconducting AgCoO2 thin films were deposited by rf magnetron sputtering of sintered AgCoO2 target. The AgCoO2 films grown by rf sputtering were highly c-axis oriented showing only (001) reflections in the X-ray diffraction pattern unlike in the case of amorphous films grown by pulsed laser deposition (PLD). The bulk powder of AgCoO2 was synthesized by hydrothermal process. The optical bandgap was estimated as 4⋅15 eV and has a transmission of about 50% in the visible region. The temperature depend- ence of conductivity shows a semiconducting behaviour. The positive sign of Seebeck coefficient (+220 μVK -1 ) indicates p-type conductivity. Transparent p-n heterojunction on glass substrate was fabricated by rf magne- tron sputtering of p-AgCoO2 and n-type ZnO : Al thin films. The structure of the diode was glass/ITO/n- ZnO/p-AgCoO2. The junction between p-AgCoO2 and n-ZnO was found to be rectifying.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Copper-based nanomaterials and applications · ZnO doping and properties · Gas Sensing Nanomaterials and Sensors
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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