journal article·1999-05

Transient thermal process induced by swift heavy ions: Defect annealing and defect creation in Fe and Ni

Ch. Dufour, Z G Wang, E Paumier, M Toulemonde

Bulletin of Materials Science· Volume 22· Issue 3
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OpenAlex topics: Ion-surface interactions and analysis · Integrated Circuits and Semiconductor Failure Analysis · Silicon and Solar Cell Technologies

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