journal article·2014-12

Electric field dependence of the electron mobility in bulk wurtzite ZnO

K ALFARAMAWI

Bulletin of Materials Science· Volume 37· Issue 7
Publisher page

Abstract

The electric field dependence of the electron mobility in bulk wurtzite zinc oxide (ZnO) material is studied. The low-field electron mobility is calculated as a function of doping concentration and lattice temperature. The results show that above nearly 50 K the electrical conduction is governed by activation through the bulk material and the conduction is then influenced by both lattice and impurity scattering mechanisms. The high-field characteristics are also considered. The transition between the low-field and high-field regions is specified. The negative differential mobility for bulk ZnO at room temperature is observed at electric fields above 280 kV/cm.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: ZnO doping and properties · Gas Sensing Nanomaterials and Sensors · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (15)

Show source-provided references
1. Arabshahi H, Rokn-Abadi R and Golafroz S 2009 Modern Phys. Lett. B23 280710.1142/S0217984909020916 ↗
2. Arora N D, Hauser J R and Roulston D J 1982 IEEE Trans. Electron. Dev. 29 29210.1109/T-ED.1982.20698 ↗
3. Bellotti E et al 2001 Int. J. High Speed Electron. Syst. 11 52510.1142/S0129156401000940 ↗
4. Bellotti E and Bertazzi F 2007 Transport parameters for electrons and holes In J Piprek (ed.) Nitride semiconductor devices: Principles and simulation (Weinheim: Wiley-VCH Verlag) Chap. 4, p 6910.1002/9783527610723.ch4 ↗
5. Bertazzi F, Bellotti E, Furno E and Goano M 2009 J. Electron. Mater. 38 167710.1007/s11664-009-0809-0 ↗
6. Caughey D M and Thomas R E 1967 Proc. IEEE 55 219210.1109/PROC.1967.6123 ↗
7. Dorkel J M and Leturcq P H 1981 Solid-State Electron. 24 821110.1016/0038-1101(81)90097-6 ↗
8. Furno E, Bertazzi F, Goano M, Ghione G and Bellotti E 2008 Solid State Electron. 52 179610.1016/j.sse.2008.08.001 ↗
9. Goano M, Bertazzi F, Penna M and Bellotti E 2007 J. Appl. Phys. 102 08370910.1063/1.2794380 ↗
10. Klaassen D B M 1992 Solid-State Electron. 35 95310.1016/0038-1101(92)90325-7 ↗
11. Look D C, Reynolds D C, Sizelove J R, Jones R L, Litton C W, Cantwell G and Harsch W C 1998 Solid State Commun. 105 33910.1016/S0038-1098(97)10056-4 ↗
12. Masetti G, Severi M and Solmi S 1983 IEEE Trans. Electron Dev. 30 76410.1109/T-ED.1983.21207 ↗
13. Ozgur U, Alivov Y I, Liu C, Teke A, Reshchikov M A, Dogan S, Avrutin V, Cho S J and Morkoc H 2005 J. Appl. Phys. 98 04130110.1063/1.1992666 ↗
14. Schroder D K 1987 Modular Series on solid state devices: Advanced MOS Devices (New York: Addison-Wesley Publishing Company)
15. Yang L, Yang Yao Q, Zhang X, Liu Q and Hao V 2010 Proceedings of 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (Shanghai, China: IEEE Press) p 156610.1109/ICSICT.2010.5667465 ↗