journal article·2012-10

Comparative studies of spray pyrolysis deposited copper sulfide nanostructural thin films on glass and FTO coated glass

MEHDI ADELIFARD, HOSEIN ESHGHI, MOHAMAD MEHDI BAGHERI MOHAGHEGHI

Bulletin of Materials Science· Volume 35· Issue 5
Publisher page

Abstract

CuxS thin films with different Cu to S molar ratios (0·33 and 0·43) have been deposited by spray pyrolysis method on glass and FTO coated glass substrates using an aqueous solution of copper (II) acetate and thiourea at a substrate temperature of 285°C. The structural, surface morphological, optical and electrical characterizations of the samples were carried out using XRD, FESEM, UV-Vis and PL spectrophotometer and four-probe apparatus, respectively. X-ray diffraction analysis showed that while the layer/glass sample has an individual CuS (covellite) crystalline phase, the layer/FTO sample includes two additional phases of Cu2S (chalcocite) and Cu1·8S (digenite) as well. Optical measurements showed that all these materials have a relatively high absorption coefficient (~5 × 104–2·3 × 105 cm − 1) in the visible region and direct bandgap of the layers was confirmed with the corresponding room temperature PL spectra. With the resistivity measurements at room and higher temperatures (up to 100°C) confirm that all samples are degenerate in nature with high electrical conductivities of ~103 (Ω.cm) − 1.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Copper-based nanomaterials and applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (29)

Show source-provided references
1. Boller A, Grossberg M, Asenjo B and Gutierrez M T 2009 Surf. Coat. Technol. 204 59310.1016/j.surfcoat.2009.08.037 ↗
2. Bouaziz M, Amlouk M and Belgacem S 2009 Thin Solid Films 517 252710.1016/j.tsf.2008.11.039 ↗
3. Gadgil S B, Thangaraj R, Lyer J V, Sharma A K, Gupta B K and Agnihotri O P 1981 Sol. Energ. Mater. 5 12910.1016/0165-1633(81)90024-1 ↗
4. Isac L, Duta A, Kriza A, Nanu M, Dumitrescu L and Schoonman J 2006 Proc. 7th int. conf on technology and quality for sustained development TQSD (Bucharest, Romania: AGIR Publishing House) p. 745
5. Isac L, Duta A, Kriza A, Manolache S and Nanu M 2007a Thin Solid Films 515 575510.1016/j.tsf.2006.12.073 ↗
6. Isac L A, Duta A, Kriza A, Enesca I A and Nanu M 2007b J. Phys. Conf. Ser. 61 47710.1088/1742-6596/61/1/096 ↗
7. Li F, Kong T, Bi W T, Li D C, Li Z and Huang X T 2009 Appl. Surf. Sci. 255 628510.1016/j.apsusc.2009.02.001 ↗
8. Lindroos S, Arnold A and Leskela M 2000 Appl. Surf. Sci. 158 7510.1016/S0169-4332(99)00582-6 ↗
9. Liu J and Xue D F 2009 J. Cryst. Growth 311 50010.1016/j.jcrysgro.2008.09.025 ↗
10. Madarasz J, Okuya M and Kaneko S 2001 J. Eur. Ceram. Soc. 21 211310.1016/S0955-2219(01)00183-2 ↗
11. Manoj P K, Joseph B, Vaidyan V K and Sumangala Devi Amma D 2007 Ceram. Int. 33 27310.1016/j.ceramint.2005.09.016 ↗
12. Mattox D M and Sowel R R 1974 J. Vac. Sci. Technol. 11 79310.1116/1.1312754 ↗
13. Nair M T S and Nair P K 1989 Semicond. Sci. Technol. 4 19110.1088/0268-1242/4/3/009 ↗
14. Nair P K and Nair M T S 1991 Appl. Phys. 24 8310.1088/0022-3727/24/1/016 ↗
15. Nair P K, Nair M T S, Campos J and Sansorex L E 1987 Sol. Cells 22 21110.1016/0379-6787(87)90045-7 ↗
16. Nair P K, Campos J and Nair M T S 1988 Semicond. Sci. Technol. 3 13410.1088/0268-1242/3/2/010 ↗
17. Nair P K, Garcia V M, Fernandez A M, Ruiz H S and Nair M T S 1991 J. Phys. D 24 44110.1088/0022-3727/24/3/031 ↗
18. Nair M T S, Laura G and Nair P K 1998 Semicond. Sci. Technol. 13 116410.1088/0268-1242/13/10/019 ↗
19. Nascu H and Popescu V 2003 Proc. int. conf. mater. sci. eng. BRAMAT (Brasov Transilvania: Univ. Publishing House). 5 p. 61
20. Naumov A V, Semenov V N, Lukin A N and Goncharov E G 2002 Inorg. Mater. 38 27110.1023/A:1014779018372 ↗
21. Nomura R, Miyawaki K, Toyosaki T and Matsuda H 1996 Chem. Vap. Depos. 2 1710.1002/cvde.19960020105 ↗
22. Podder J, Kobayashi R and Ichimura M 2005 Thin Solid Films 427 7110.1016/j.tsf.2004.06.137 ↗
23. Popovici I, Isac L and Duta A 2009 Bull. Transilvania. Univ. 2 51
24. Rodriguez-Lazcano Y, Martinez H, Calixto-Rodriguez M and Nunez Rodriguez A 2009 Thin Solid Films 517 595110.1016/j.tsf.2009.03.075 ↗
25. Sagade A A and Sharma R 2008 Sensor. Actuat. B Chem. 133 13510.1016/j.snb.2008.02.015 ↗
26. Sebastian P J, Gomez-Daza O, Campos J, Banos L and Nair P K 1994 Sol. Energ. Mater. Sol. C. 32 15910.1016/0927-0248(94)90301-8 ↗
27. Shaomin Ou, Qin Xie, Dekun Ma, Jianbo Liang, Xiaokai Hu, Weichao Yu and Yitai Qian 2005 Mater. Chem. Phys. 94 46010.1016/j.matchemphys.2005.04.057 ↗
28. Thongtem T, Phuruangrat A and Thongtem S 2009 Curr. Appl. Phys. 9 19510.1016/j.cap.2008.01.011 ↗
29. Yuan K D, Wu J J, Liu M L, Zhang L L, Xu F F, Chen L D and Huang F Q 2008 Appl. Phys. Lett. 93 13210610.1063/1.2991441 ↗