Influence of substrate on structural, morphological and optical properties of ZnO films grown by SILAR method
Source abstract
Abstract
ZnO films were obtained by successive ionic layer adsorption and reaction (SILAR) method from four different substrates: glass microslides, corning glass, quartz and silicon with and without oxide layer. For films deposition, a precursor solution of ZnSO4 was used, complexed with ammonium hydroxide. Prior to the film deposition, wettability of the substrates was analysed using a CCD camera. It was found that the Si without the oxide layer substrate shows hydrophobic behaviour, which makes the films less adherent and not uniform, while in the other substrates, the behaviour was optimal for the growing process. ZnO films grown on glass microslides, corning glass, quartz and Si with oxide layer were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) and UV-Vis techniques. According to the XRD patterns, the films were polycrystalline, with hexagonal wurtzite structure and the patterns mentioned showed significant differences in crystallite sizes, microstrain and texture coefficient with respect to the employed substrates. The morphology of the ZnO films constituted by rice-like and flower-like structures shows differences in form and size depending on the substrate. The UV-Vis spectroscopy results show that the substrate did not influence the band gap energy value obtained from films.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: ZnO doping and properties · Gas Sensing Nanomaterials and Sensors · Copper-based nanomaterials and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (41)
Show source-provided references
1. Bach H and Krause D 2005 Low thermal expansion glass ceramics (New York: Springer Berlin Heidelberg) 2nd edn10.1007/3-540-28245-9 ↗
2. Bai S N 2010 Optoelectron. Adv. Mater. 4 654
3. Cao B Q et al 2007 Nanotechnology 18 45570710.1088/0957-4484/18/45/455707 ↗
4. Cerofolini G F et al 1997 J. Non-Cryst. Solids 216 14010.1016/S0022-3093(97)00180-4 ↗
5. Cheng P et al 2008 Opt. Express 16 889610.1364/OE.16.008896 ↗
6. Chu J B et al 2009 Appl. Phys. A95 84910.1007/s00339-009-5084-7 ↗
7. Dutta S et al 2009 Prog. Mater. Sci. 54 8910.1016/j.pmatsci.2008.07.002 ↗
8. Egerton E et al 2005 J. Electron. Mater. 34 94910.1007/s11664-005-0048-y ↗
9. Gao X D et al 2004 Appl. Surf. Sci. 229 27510.1016/j.apsusc.2004.02.004 ↗
10. Hashimoto K et al 2005 Jpn. J. Appl. Phys. 144 826910.1143/JJAP.44.8269 ↗
11. Hermansson K et al 1991 Solid State Sensors Actuat. Int. Conf. 24 193
12. Jiménez-García F N et al 2011 Thin Solid Films 519 763810.1016/j.tsf.2011.05.008 ↗
13. Keis K et al 2002 Sol. Energy 73 51
14. Kihara K and Donnay G 1985 Canad. Mineral. 23 647
15. Kim T Y et al 2004 Synh. Metals 144 6110.1016/j.synthmet.2004.01.010 ↗
16. Liang S et al 2001 J. Cryst. Growth 225 11010.1016/S0022-0248(01)00830-2 ↗
17. Ljungberg K, Wderbarg A and Bklund Y 1993 Appl. Phys. Lett. 62 2210.1063/1.108679 ↗
18. Lokhande C D 2003 Solar Mater. Solar Cells 79 29310.1016/S0927-0248(02)00413-0 ↗
19. Mittemeijer E and Welzel U 2008 Kristallogr. 223 55210.1524/zkri.2008.1213 ↗
20. Mitra P et al 1998 Mater. Lett. 35 3310.1016/S0167-577X(97)00215-2 ↗
21. Mitra P and Khan J 2006 Mater. Chem. Phys. 98 27910.1016/j.matchemphys.2005.09.042 ↗
22. Moholkar A V et al 2007 J. Phys. Chem. Solids 68 198110.1016/j.jpcs.2007.06.024 ↗
23. Nguyen T et al 2009 Phys. Eng. New Mater. 127 17710.1007/978-3-540-88201-5_20 ↗
24. Ortega-López M et al 2003 Mater. Res. Bull. 38 124110.1016/S0025-5408(03)00083-7 ↗
25. Pathan H M and Lokhande C D 2004 Bull. Mater. Sci. 27 8510.1007/BF02708491 ↗
26. Pawar S M et al 2010 J. Nanosci. Nanotechnol. 10 341210.1166/jnn.2010.2306 ↗
27. Pawar S M et al 2011 Curr. Appl. Phys. 11 11710.1016/j.cap.2010.07.007 ↗
28. Pizzini N et al 1989 J. Electrochem. Soc. 136 194510.1149/1.2097092 ↗
29. Rambu A P et al 2012 Mater. Sci. Eng. B177 15710.1016/j.mseb.2011.10.015 ↗
30. Robert E Dinnebier and Simon J L Billinge 2008 Powder diffraction theory and practice (Cambridge: RSC Publishing)
31. Saito N 2002 Adv. Mater. 14 41810.1002/1521-4095(20020318)14:6<418::AID-ADMA418>3.0.CO;2-K ↗
32. Shan F K et al 2004 J. Eur. Ceram. Soc. 24 101510.1016/S0955-2219(03)00397-2 ↗
33. Shen G et al 2005 J. Phys. Chem. B109 1057810.1021/jp051078a ↗
34. Shinde V R et al 2005 Appl. Surf. Sci. 245 40710.1016/j.apsusc.2004.10.036 ↗
35. Sillen L G and Martell A F (eds) 1971 Stability constant of metal ion complexes (London: The Chemical Society), Special Publication No. 25, Suppl. 1
36. Srivastava R et al 2007 Sens. Trans. J. 80 1295
37. Suresh P et al 2008 Appl. Surf. Sci. 255 238210.1016/j.apsusc.2008.07.136 ↗
38. Vargas-Hernández V et al 2008 Microelectr. J. 39 134710.1016/j.mejo.2008.01.057 ↗
39. Vargas-Hernández V 2008 Microelectr. J. 39 134910.1016/j.mejo.2008.01.056 ↗
40. Villanueva Y Y et al 2006 Thin Solid Films 501 36610.1016/j.tsf.2005.07.152 ↗
41. Zhang N et al 2009 Mater. Lett. 63 49610.1016/j.matlet.2008.11.046 ↗