journal article·2026-07-10Open access

FabricDefectNet: An AI-Driven Fabric Inspection System Utilizing Simulation Images as Reference Information

Ming Liu, Shohei Kato

Abstract

This paper introduces FabricDefectNet, an AI-driven visual inspection system for automating weaving inspection in the textile industry. Conventional AI inspection systems require many defective sample images for training, and the cost of data collection is a significant barrier to practical application, especially in today’s high-mix, low-volume production environment. To solve this problem, our system adopts a novel approach that uses fabric simulation images (generated from design data) not as direct training data, but as reference templates for comparison with the actual fabric. The core of the proposed system consists of three stages: (1) robust feature matching between the simulation image and the real fabric image using the state-of-the-art LightGlue matcher; (2) precise correction of non-rigid deformations (stretching, distortion, skew) in the fabric image using Thin Plate Spline (TPS) warping; and (3) pixel-wise anomaly detection by measuring cosine distances between the aligned patches. Evaluation experiments with a prototype system demonstrate that FabricDefectNet can accurately detect major defects such as color mismatches, pattern errors, and pitch differences without using any actual defect samples. This work demonstrates a practical AI tool that can detect unknown defects using only normal (design) data, which is expected to improve the efficiency and consistency of quality control in textile manufacturing.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Industrial Vision Systems and Defect Detection · Textile materials and evaluations · Generative Adversarial Networks and Image Synthesis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Graduate School of Engineering Nagoya Institute of Technology, Japan

References (33)

Show source-provided references
1. I. K. Nti, A.F.Adekoya, B.A.Weyori, and O. Nyarko-Boateng, J. Intell. Manuf., 33, 1581 (2022).10.1007/s10845-021-01771-6 ↗
2. J. Jing, H. Ma, and H. Zhang, Color. Technol., 135, 213 (2019).10.1111/cote.12394 ↗
3. A. Kumar, IEEE Trans. Ind. Electron., 55, 348 (2008).10.1109/TIE.1930.896476 ↗
4. Y. Kahraman and A. Durmuşoğlu, Text. Res. J., 93, 1485 (2023).10.1177/00405175221130773 ↗
5. A. Rasheed, B. Zafar, A. Rasheed, N. Ali, M. Sajid, S. H. Dar, U. Habib, T. Shehryar, and M. T. Mahmood, Math. Probl. Eng., 2020, 8189403 (2020).10.1155/2020/8189403 ↗
6. J. Redmon and A. Farhadi, Proc. IEEE Conf. Comput. Vis. Pattern Recognit., 7263 (2017).
7. H. Y. T. Ngan, G. K. H. Pang, and N. H. C. Yung, Image Vis. Comput., 29, 442 (2011).10.1016/j.imavis.2011.02.002 ↗
8. J. Deng, W. Dong, R. Socher, L.-J. Li, K. Li, and L. Fei-Fei, Proc. IEEE Conf. Comput. Vis. Pattern Recognit., 248 (2009).10.1109/CVPR.2009.5206848 ↗
9. M. Biradar, B. Shiparamatti, and P. Patil, Opt. Mem. Neural Netw., 30, 250 (2021).10.3103/S1060992X21030024 ↗
10. R. Chalapathy and S. Chawla, ACM Comput. Surv., 52, 1(2019).10.1145/3342555 ↗
11. L. Ruff, R. Vandermeulen, N. Goernitz, L. Deecke, S. A. Siddiqui, A. Binder, E. Müller, and M. Kloft, Proc. Int. Conf. Mach. Learn., 4393 (2018).
12. P. Bergmann, M. Fauser, D. Sattlegger, and C. Steger, Proc. IEEE Conf. Comput. Vis. Pattern Recognit., 9592 (2019).
13. T. Schlegl, P. Seeböck, S. M. Waldstein, U. Schmidt-Erfurth and G. Langs, Proc. Inf. Process. Med. Imaging, 146 (2017).10.1007/978-3-319-59050-9_12 ↗
14. K. Bousmalis, A. Irpan, P. Wohlhart, Y. Bai, M. Kelcey, M. Kalakrishnan, L. Downs, J. Ibarz, P. Pastor, K. Konolige, S. Levine, and V. Vanhoucke, Proc. IEEE Int. Conf. Robot. Autom., 4243 (2018).10.1109/ICRA.2018.8460875 ↗
15. D. G. Lowe, Int. J. Comput. Vis., 60, 91 (2004).10.1023/B:VISI.0000029664.99615.94 ↗
16. P. Lindenberger, P.-E. Sarlin, and M. Pollefeys, Proc. IEEE/CVF Int. Conf. Comput. Vis., 15723 (2023).
17. F. L. Bookstein, IEEE Trans. Pattern Anal. Mach. Intell., 11, 567 (1989).10.1109/34.24792 ↗
18. C. R. Maurer Jr. and J. M. Fitzpatrick, Interactive Image-Guided Neurosurgery, 17 (1993).
19. K. Simonyan and A. Zisserman, arXiv: 1409.1556, (2014).
20. K. He, X. Zhang, S. Ren, and J. Sun, Proc. IEEE Conf. Comput. Vis. Pattern Recognit., 770 (2016).10.1109/CVPR.2016.90 ↗
21. R. Fan, M. J. L. Wong, and J. C. W. Yeung, IEEE Trans. Autom. Sci. Eng., 18, 921 (2021).
22. T. Wang, L. Wang, X. Gong, Z. Chang, S. Yang, J. Li, and Z. Wang, Appl. Sci., 13, 6427 (2023).10.3390/app13116427 ↗
23. M. Motahari-Nezhad and S. M. Jafari, Measurement, 166, 108154 (2020).10.1016/j.measurement.2020.108154 ↗
24. S. Mallat, A Wavelet Tour of Signal Processing, Academic Press, (1999).10.1016/B978-012466606-1/50008-8 ↗
25. D. K. Prasad, J. King Saud Univ. Comput. Inf. Sci., 34, 5565 (2022).
26. X. Wang, T. Xu, and H. He, IEEE Access, 8, 119854 (2020).10.1109/ACCESS.2020.3014350 ↗
27. R. Schultheiss, T. Runkel, and B. Schick, Sensors, 22, 8963 (2022).
28. C. J. H. E. L. Lin, Mach. Vis. Appl., 23, 325(2012).
29. Y. Li, D. Chen, and X. Wang, Neurocomputing, 509, 123 (2022).
30. Y. Liu, Z. Wang, and J. Zhang, IEEE Trans. Ind. Inf., 18, 104 (2022).10.1109/TII.2021.3071753 ↗
31. M. D. Zeiler and R. Fergus, Comput. Vis. – ECCV 2014, Lect. Notes Comput. Sci., 8689, 818 (2014).10.1007/978-3-319-10590-1_53 ↗
32. L. A. Gatys, A. S. Ecker, and M. Bethge, Adv. Neural Inf. Process. Syst., 28, 262 (2015).
33. D. Bau, B.Zhou, A. Khosla, A. Oliva, and A. Torralba, Proc. IEEE Conf. Comput. Vis. Pattern Recognit., 6541 (2017).