journal article·2020-01Open access

Fabric defect detection using the improved YOLOv3 model

Junfeng Jing, Dong Zhuo, Huanhuan Zhang, Yong Liang, Min Zheng

Abstract

To improve the detection rate of defect and the fabric product quality, a higher real-time performance fabric defect detection method based on the improved YOLOv3 model is proposed. There are two key steps: first, on the basis of YOLOv3, the dimension clustering of target frames is carried out by combining the fabric defect size and k-means algorithm to determine the number and size of prior frames. Second, the low-level features are combined with the high-level information, and the YOLO detection layer is added on to the feature maps of different sizes, so that it can be better applied to the defect detection of the gray cloth and the lattice fabric. The error detection rate of the improved network model is less than 5% for both gray cloth and checked cloth. Experimental results show that the proposed method can detect and mark fabric defects more effectively than YOLOv3, and effectively reduce the error detection rate.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Industrial Vision Systems and Defect Detection · Image Processing Techniques and Applications · Visual Attention and Saliency Detection

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Xi’an Polytechnic University, Xi’an, China

Funding

scientific research and sharing platform construction project of shaanxi province · National Natural Science Foundation of China · the Key Research and Development Program of Shaanxi Province · shaanxi university of science and technology · Shaanxi Provincial Association of Science and Technology Young Talents Promotion Program · xi’an polytechnic university

References (20)

Show source-provided references
1. 10.1016/j.neucom.2017.01.03910.1016/j.neucom.2017.01.039 ↗
2. Jing J-F · Color Technol · 2016 · 133 · 2610.1111/cote.12239 ↗
3. Pan Q · J Eng Fiber Fabr · 2018 · 13 · 78
4. 10.1126/science.112764710.1126/science.1127647 ↗
5. Girshick R · 1 · 580
6. 10.1109/TPAMI.2015.238982410.1109/TPAMI.2015.2389824 ↗
7. Girshick R · 11440
8. 10.1109/TPAMI.2016.257703110.1109/TPAMI.2016.2577031 ↗
9. Redmon J · Comp Vis Pattern Recognit · 2016 · 1 · 779
10. Neubeck A · 3 · 850
11. Redmon J · 1 · 6517
12. Ioffe S · Int Conf Mach Learn · 2015 · 37 · 448
13. Zhang Y · Int C Patt Recog · 2012 · 1 · 3062
14. Ji H · Adv Text Technol · 2011 · 2 · 11
15. De G · Appl Phys Lett · 1996 · 68 · 382010.1063/1.116628 ↗
16. Kim KJ · 1 · 1
17. Lin TY · 1 · 936
18. 10.1016/j.compag.2019.01.01210.1016/j.compag.2019.01.012 ↗
19. Zhang X · Sensors · 2018 · 18 · E430810.3390/s18124308 ↗
20. Tang C · Appl Sci · 2018 · 8 · 142310.3390/app8091423 ↗