journal article·1995-09

Characterization of liquid-phase epitaxially grown HgCdTe films by magnetoresistance measurements

J. S. Kim, D. G. Seiler, L. Colombo, M. C. Chen

Journal of Electronic Materials· Volume 24· Issue 9
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Abstract

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Research context

OpenAlex topics: Advanced Semiconductor Detectors and Materials · Quantum and electron transport phenomena · Semiconductor Quantum Structures and Devices

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References (8)

Show source-provided references
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2. A.C. Beer,Solid State Physics, Suppl. 4, Galvanomagnetic Effects in Semiconductors, ed. F. Seitz and D. Turnbull (New York: Academic Press, 1963).
3. D.C. Look,Electrical Characterization of GaAs Materials and Devices (New York: Wiley, 1989).
4. J.S. Kim, D.G. Seiler and W.F. Tseng,J. Appl. Phys. 73,8324 (1993).10.1063/1.353424 ↗
5. J.S. Kim, D.G. Seiler, L. Colombo and M.C. Chen,Semicond. Sci. Technol. 9, 1696 (1994). 410.1088/0268-1242/9/9/020 ↗
6. J.S. Kim and D.G. Seiler, to be published.
7. M.C. Chen, S.G.Parker and D.F.Weirauch,J.Appl.Phys. 58, 3150(1985).10.1063/1.335819 ↗
8. C. Herring,J. Appl. Phys. 31, 1939 (1960).10.1063/1.1735477 ↗