journal article·2006-04

Selective and nonselective wet etching of Zn0.9Mg0.1O/ZnO

Jau-Jiun Chen, Soohwan Jang, F. Ren, Yuanjie Li, Hyun-Sik Kim, D. P. Norton, S. J. Pearton, A. Osinsky, S. N. G. Chu, J. F. Weaver

Journal of Electronic Materials· Volume 35· Issue 4
Publisher page

Abstract

Wet etch rates at 25°C for Zn0.9Mg0.1O grown on sapphire substrates by pulsed laser deposition (PLD) were in the range 300–1100 nm · min−1 with HCl/H2O (5×10−3−2×10−2 M) and 120–300 nm · min−1 with H3PO4/H2O (5×10−3−2×10−2 M). Both of these dilute mixtures exhibited diffusion-limited etching, with thermal activation energies of 2–3 kCal · mol−1. By sharp contrast, the etch rates for ZnO also grown on sapphire by PLD were much slower in similar solutions, with rates of 1.2–50 nm · min−1 in HCl/H2O (0.01–1.2 M) and 12–54 nm · min−1 in H3PO4/H2O (0.02–0.15 M). The etching was reaction limited over the temperature range 25–75°C, with activation energies close to 6 kCal · mol−1. The resulting selectivity of Zn0.9Mg0.1O over ZnO can be a high as ∼400 with HCl and ∼30 with H3PO4.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: ZnO doping and properties · Copper-based nanomaterials and applications · Gas Sensing Nanomaterials and Sensors

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (41)

Show source-provided references
1. See, for example, Semiconducting Transparent Thin Films, eds. H.L. Hartnagel, A.L. Dawar, A.K. Jain, and C. Jagadish (Bristol, U.K.: IOP Publishing, 1995), pp. 276–282.
2. D.C. Look, Mater. Sci. Eng. B80, 383 (2001).10.1016/S0921-5107(00)00604-8 ↗
3. P. Zu, Z.K. Tang, G.K.L. Wong, M. Kawasaki, A. Ohtomo, K. Koinuma, and Y. Sagawa, Solid State Commun. 103, 459 (1997).10.1016/S0038-1098(97)00216-0 ↗
4. D.M. Bagnall, Y.R. Chen, Z. Zhu, T. Yao, S. Koyama, M.Y. Shen, and T. Goto, Appl. Phys. Lett. 70, 2230 (1997).10.1063/1.118824 ↗
5. M. Wraback, H. Shen, S. Liang, C.R. Gorla, and Y. Lu, Appl. Phys. Lett. 74, 507 (1999).10.1063/1.124223 ↗
6. J.-M. Lee, K.-K. Kim, S.-J. Park, and W.-K. Choi, Appl. Phys. Lett. 78, 2842 (2001).
7. J.E. Nause, III-V’s Rev. 12, 28 (1999).10.1016/S0961-1290(99)80077-5 ↗
8. Y. Chen, D. Bagnell, and T. Yao, Mater. Sci. Eng. B75, 190 (2000).10.1016/S0921-5107(00)00372-X ↗
9. D.C. Look, D.C. Reynolds, J.W. Hemsky, R.L. Jones, and J.R. Sizelove, Appl. Phys. Lett. 75, 811 (1999).10.1063/1.124521 ↗
10. D.C. Look, J.W. Hemsky, and J.R. Sizelove, Phys. Rev. Lett. 82, 2552 (1999).10.1103/PhysRevLett.82.2552 ↗
11. F.D. Auret, S.A. Goodman, M. Hayes, M.J. Legodi, H.A. van Laarhoven, and D.C. Look, Appl. Phys. Lett. 80, 956 (2002).10.1063/1.1452781 ↗
12. S.O. Kucheyev, J.E. Bradley, J.S. Williams, C. Jagadish, and M.V. Swain, Appl. Phys. Lett. 80, 956 (2002).10.1063/1.1448175 ↗
13. D.C. Reynolds, D.C. Look, and B. Jogai, Solid State Commun. 99, 873 (1996).10.1016/0038-1098(96)00340-7 ↗
14. M. Wraback, H. Shen, S. Liang, C.R. Gorla, and Y. Lu, Appl. Phys. Lett. 76, 507 (1999).10.1063/1.124223 ↗
15. T. Aoki, D.C. Look, and Y. Hatanaka, Appl. Phys. Lett. 76, 3257 (2000).10.1063/1.126599 ↗
16. C.C. Chang and Y.E. Chen, IEEE Trans. Ultrasonics, Ferroelectrics Frequency Control 44, 624 (1997).10.1109/58.658315 ↗
17. P.M. Verghese and D.R. Clarke, J. Appl. Phys. 87, 4430 (2000).10.1063/1.373088 ↗
18. C.R. Gorla, N.W. Emanetoglu, S. Liang, W.E. Mayo, Y. Lu, M. Wraback, and H. Shen, J. Appl. Phys. 85, 2595 (1999).10.1063/1.369577 ↗
19. H. Ohta, K. Kawamura, M. Orita, M. Hirano, N. Sarukura, and H. Hosono, Appl. Phys. Lett. 77, 475 (2000).10.1063/1.127015 ↗
20. M. Joseph, H. Tabata, and T. Kawai, Jpn. J. Appl. Phys. 38, L1205 (1999).10.1143/JJAP.38.L1205 ↗
21. S. Krishnamoorthy, A.A. Iliadis, A. Inumpudi, S. Choopun, R.D. Vispute, and T. Venkatesan, Solid-State Electron. 46, 1631 (2002).10.1016/S0038-1101(02)00117-X ↗
22. Y. Li, G.S. Tompa, S. Liang, C. Gorla, C. Lu, and J. Doyle, J. Vac. Sci. Technol. A15, 1663 (1997).
23. Y.R. Ryu, T.S. Lee, J.H. Leem, and H.W. White, Appl. Phys. Lett. 83, 4032 (2003).10.1063/1.1625787 ↗
24. X.-L. Guo, J.-H. Choi, H. Tabata, and T. Kawai, Jpn. J. Appl. Phys., Part 2 40, L177 (2001).10.1143/JJAP.40.L177 ↗
25. T. Aoki and Y. Hatanaka, Appl. Phys. Lett. 76, 3257 (2000).10.1063/1.126599 ↗
26. Y.I. Alivov, J.E. Van Nostrand, D.C. Look, M.V. Chukichev, and B.M. Ataev, Appl. Phys. Lett. 83, 2943 (2003).10.1063/1.1615308 ↗
27. Y.I. Alivov, E.V. Kalinina, A.E. Cherenkov, D.C. Look, B.M. Ataev, A.K. Omaev, M.V. Chukichev, and D.M. Bagnall, Appl. Phys. Lett. 83, 4719 (2003).10.1063/1.1632537 ↗
28. H. Hosono, H. Ohta, K. Hayashi, M. Orita, and M. Hirano, J. Cryst. Growth 237–239, 496 (2001).
29. A. Osinsky, J.W. Dong, M.Z. Kauser, B. Hertog, A.M. Dabiran, P.P. Chow, S.J. Pearton, O. Lopatiuk, and L. Chernyak, Appl. Phys. Lett. 85, 4272 (2004).10.1063/1.1815377 ↗
30. J.W. Dong, A. Osinsky, B. Hertog, A.M. Dabiran, P.P. Chow, Y.W. Heo, D.P. Norton, and S.J. Pearton, J. Electron. Mater. 34, 416 (2005).10.1007/s11664-005-0121-6 ↗
31. Dae-Kue Hwang, Soon-Hyung Kang, Jae-Hong Lim, Eun-Jeong Yang, Jin-Yong Oh, Jin-Ho Yang, and Seong-Ju Park, Appl. Phys. Lett. 86, 222101 (2005).10.1063/1.1940736 ↗
32. A. Tsukazaki et al. Nat. Mater. 4, 42 (2005).10.1038/nmat1284 ↗
33. A. Tsukazaki, M. Kubota, A. Ohtomo, T. Onuma, K. Ohtani, H. Ohno, S.F. Chichibu, and M. Kawasaki, Jpn. J. Appl. Phys. 44, L643 (2005).10.1143/JJAP.44.L643 ↗
34. A. Ohtomo, M. Kawasaki, I. Ohkubo, H. Koinuma, T. Yasuda, and Y. Segawa, Appl. Phys. Lett. 75, 980 (1999).10.1063/1.124573 ↗
35. F.P. Koffyberg, Phys. Rev. B: Condens. Matter Mater. Phys. 13, 4470 (1976).10.1103/PhysRevB.13.4470 ↗
36. Y. Li, G.S. Tompa, S. Liang, C. Gorla, C. Lu, and J. Doyle, J. Vac. Sci. Techol. A15, 1663 (1997).
37. J.G.E. Gardeniers, Z.M. Rittersma, and G.J. Burger. J. Appl. Phys. 83, 7844 (1998).10.1063/1.367959 ↗
38. H. Maki, T. Ikoma, I. Sakaguchi, N. Ohashi, H. Haneda, J. Tanaka, and N. Ichinose, Thin Solid Films, in press.
39. S.-C. Chang, D.B. Hicks, and R.C.O. Laugal, Techn. Dig. IEEE Solid-State Sensor Actuator Workshop 41, 218 (1992).
40. Y.W. Heo, Y.W. Kwon, Y. Li, S.J. Pearton, and D.P. Norton, Appl. Phys. Lett. 84, 3474 (2004).10.1063/1.1737795 ↗
41. K. Ip, K. Baik, M.E. Overberg, E.S. Lambers, Y.W. Heo, D.P. Norton, S.J. Pearton, F. Ren, and J.M. Zavada, Appl. Phys. Lett. 81, 3546 (2002).10.1063/1.1519095 ↗