journal article·1990-02

Optical absorption studies of Si implanted SiO2

A. Kalnitsky, J. P. Ellul, A. R. Boothroyd, R. S. Abbott

Journal of Electronic Materials· Volume 19· Issue 2
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Abstract

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Research context

OpenAlex topics: Silicon Nanostructures and Photoluminescence · Silicon and Solar Cell Technologies · Semiconductor materials and interfaces

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References (30)

Show source-provided references
1. E. W. J. Mitchell and E. G. S. Paige, Phil. Mag.1, 1085 (1956).10.1080/14786435608238193 ↗
2. R. A. Weeks, C. M. Nelson, J. Am. Ceram. Soc.43, 399 (1960).10.1111/j.1151-2916.1960.tb13682.x ↗
3. C. M. Nelson and J. H. Crowford, Jr., J. Phys. Chem. Solids13, 296 (1960).10.1016/0022-3697(60)90014-7 ↗
4. C. M. Nelson, R. A. Weeks, J. Am. Ceram. Soc.43, 396 (1960).10.1111/j.1151-2916.1960.tb13681.x ↗
5. D. L. Griscom in ‘Physics of SiO2 and Its Interfaces’, Ed. S. T. Pantelides, Pergamon Press (1978) p. 232.10.1016/B978-0-08-023049-8.50045-2 ↗
6. G. W. Arnold, IEEE Trans. Nuc. Sci.NS-20, 220 (1973).10.1109/TNS.1973.4327397 ↗
7. G. W. Arnold, in ‘Physics of SiO2 and Its Interfaces’, Ed. S. T. Pantelides, Pergamon Press (1978) p. 278.10.1016/B978-0-08-023049-8.50051-8 ↗
8. T. W. Hickmott, J. Vac. Sci. Technol.9, 311 (1972).10.1116/1.1316592 ↗
9. T. W. Hickmott, J. Appl. Phys.43, 2339 (1972).10.1063/1.1661501 ↗
10. G. W. Arnold and W. D. Compton, Phys. Rev.116, 802 (1959).10.1103/PhysRev.116.802 ↗
11. W. D. Compton and G. W. Arnold, Disc. Faraday Soc.31, 130 (1961).10.1039/df9613100130 ↗
12. G. H. Sigel Jr., E. J. Friebele, R. J. Ginter and D. L. Griscom, IEEE Trans. Nuc. Sci.NS-21, 56 (1974).10.1109/TNS.1974.6498906 ↗
13. T. W. Hickmott, J. Appl. Phys.42, 2543 (1971).10.1063/1.1660577 ↗
14. H. R. Philipp, J. Phys. Chem. Solids32, 1935 (1971).10.1016/S0022-3697(71)80159-2 ↗
15. E. Holzenkampfer, F. W. Richter, J. Stuke and U. Voget-Grote, J. Non-Cryst. Solids32, 327 (1979).10.1016/0022-3093(79)90080-2 ↗
16. T. W. Hickmott, J. Appl. Phys.45, 1050 (1974).10.1063/1.1663367 ↗
17. C. Andeen, D. Schuele, J. Appl. Phys.45, 3 1071 (1974).10.1063/1.1663369 ↗
18. E. P. O’Reilly and J. Robertson, Phys. Rev. B27, 6 (1983).10.1103/PhysRevB.27.3780 ↗
19. A. Kalnitsky, Ph.D. Thesis, Carleton University, Ottawa April (1989).
20. E. H. Poindexter and P. J. Caplan, J. Vac. Sci. Technol. A6, 1352 (1988).10.1116/1.575701 ↗
21. G. N. Greaves in ‘Physics of SiO2 and Its Interfaces’, Ed. S. T. Pantelides, Pergamon Press (1978) p. 268.10.1016/B978-0-08-023049-8.50049-X ↗
22. A. Kalnitsky, M. I. H. King, A. R. Boothroyd, J. P. Ellul and R. A. Hadaway, 45th Device Res. Conf., Santa Barbara, CA, 1987.
23. G. Hetherington, K. H. Jack, J. Phys. Chem. Glasses 5, 447 (1964).
24. A. S. Grove ‘Phys. and Techn. Semicond. Devices’, J. Wiley and Sons, N.Y., 1967, p. 48.
25. B. E. Deal and A. S. Grove, J. Appl. Phys.36, 3770 (1965).10.1063/1.1713945 ↗
26. F. J. Norton, Nature171, 701 (1961).10.1038/191701a0 ↗
27. E. P. EerNisse, J. Appl. Phys.45, 167 (1974).10.1063/1.1662952 ↗
28. R. H. Doremus, Thin Solid Films122, 191 (1984).10.1016/0040-6090(84)90046-4 ↗
29. H. M. Presby, W. I. Brown, Appl. Phys. Lett.24, 511 (1974).10.1063/1.1655033 ↗
30. E. P. EerNisse and G. F. Derbenwick, IEEE Trans. Nuc. Sci.NS-23, 1534 (1976).10.1109/TNS.1976.4328534 ↗