Cracking of low temperature solution deposited CeO2 thin films
Source abstract
Abstract
Crystalline CeO2 films grown in aqueous solutions at 45∘C on glass slides formed by the island growth mode. The film had a refractive index of 1.83 and indicated that the film had a porosity of 41.3%, which significantly lowered the elastic stiffness of the film. The film cracked only after drying in a mud crack pattern when it reached a critical thickness. This indicated that the film cracked under tensile stress due to the accumulation of tensile strains generated from grain coalescence during growth, thermal expansion mismatch during cooling and capillary stress during drying.
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Research context
OpenAlex topics: Semiconductor materials and devices · High-Temperature Coating Behaviors · Catalytic Processes in Materials Science
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