Detached growth of gallium doped germanium
Source abstract
Abstract
Detached Bridgman growth of gallium-doped germanium itself as well as the transition from detached to attached growth was observed in-situ for the first time, using a quartz-glass ampoule in a mirror furnace. Crystal diameter was 9 mm, the growth length 41 mm, and the growth velocity 0.5 mm/min. Undoped 1 1 1-oriented germanium served as seed material; the melt was doped with gallium (C0=8.2×1018 at/cm3). Detachment took place after a growth length of 7 mm and continued for 27 mm; the remaining 7 mm grew with wall contact again. The wall-free growth could be observed around the entire circumference except for some small bridges (width: a few tens of micrometers, length: some hundreds of micrometers), where the crystal grew in contact with the wall. In the detached-grown part of the crystal, the 1 1 1-related growth lines are clearly visible. The transition from attached to detached growth and vice versa did not take place along a straight line but transitioned as islands over a length of about 1 mm. The gap between the growing crystal and the container wall varied between 10 and 80 μm, as measured by a profilometer. The etch pit density is greatly reduced in the part of the crystal that grew free of the wall. An increase in the EPD is seen in the area where the crystal had contact with the ampoule wall by the bridges described above.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Solidification and crystal growth phenomena · Semiconductor Quantum Structures and Devices · Optical Coatings and Gratings
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (34)
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