Resonant reflectivity study of exciton oscillator strength in CdTe/(Cd,Mn)Te quantum wells and superlattices

I.N. Uraltsev; V.P. Kochereshko; A.V. Kavokin; G.R. Pozina; D.R. Yakovlev; G. Landwehr; R.N. Bicknell-Tassius; A. Waag

doi:10.1016/0022-0248(92)90876-k

journal article·1992-02

Resonant reflectivity study of exciton oscillator strength in CdTe/(Cd,Mn)Te quantum wells and superlattices

I.N. Uraltsev, V.P. Kochereshko, A.V. Kavokin, G.R. Pozina, D.R. Yakovlev, G. Landwehr, R.N. Bicknell-Tassius, A. Waag

Journal of Crystal Growth· Volume 117· Issue 1-4

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OpenAlex topics: Semiconductor Quantum Structures and Devices · Advanced Semiconductor Detectors and Materials · Chalcogenide Semiconductor Thin Films

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References (9)

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