Characterization of heterointerfaces in GaAs/MnAs/MnZn-ferrite structures

We have grown GaAs epitaxial films on MnZn-ferrite substrates using MnAs buffer layers and investigated their heterointerfaces with glazing incidence-angle X-ray reflectivity and X-ray photoelectron spectroscopy. It has been found that the heterointerfaces for this structure are quite abrupt and the roughness at the GaAs/MnAs and MnAs/MnZn-ferrite interfaces are 1.1 and 0.2 nm, respectively. We also found that the diffusion of atoms through the GaAs/MnAs interface into the GaAs film is negligible. These results indicate that the MnAs buffer layer for the GaAs/ferrite structure is chemically stable and promising for the application to the future magnetic electronics.