Focused ion and electron beams for synthesis and characterization of nanomaterials
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Abstract
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques
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References (17)
Show source-provided references
1. Feynman · Engineering and Science · 1960 · 23 · 22
2. Dietrich · Engineering and Science · 1986 · 49 · 24
3. 2012
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17. 10.1063/5.016259710.1063/5.0162597 ↗