Correction: AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode
Source abstract
Abstract
[This corrects the article DOI: 10.3762/bjnano.15.51.].
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Analytical Chemistry and Sensors · Smart Materials for Construction · Surface Roughness and Optical Measurements
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