journal article·2024-05-31Open access

Exfoliation of titanium nitride using a non-thermal plasma process

Priscila Jussiane Zambiazi, Dolores Ribeiro Ricci Lazar, Larissa Otubo, Rodrigo Fernando Brambilla de Souza, Almir Oliveira Neto, Cecilia Chaves Guedes-Silva

Abstract

In this study, we present a novel approach for the exfoliation of titanium nitride (TiN) powders utilizing a rapid, facile, and environmentally friendly non-thermal plasma method. This method involves the use of an electric arc and nitrogen as the ambient gas at room temperature to generate ionized particles. These ionized species interact with the ceramic crystal of TiN, resulting in a pronounced structural expansion. The exfoliated TiN products were comprehensively characterized using transmission electron microscopy, X-ray diffraction, and Raman spectroscopy. Remarkably, the cubic crystal structure of TiN was effectively retained, while the (200) crystal plane d-spacing increased from 2.08 to 3.09 Å, accompanied by a reduction in crystallite size and alterations in Raman vibrational modes. Collectively, these findings provide compelling evidence for the successful exfoliation of TiN structures using our innovative non-thermal plasma method, opening up exciting possibilities for advanced material applications.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Metal and Thin Film Mechanics · MXene and MAX Phase Materials · Diamond and Carbon-based Materials Research

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (26)

Show source-provided references
1. 10.1126/science.110289610.1126/science.1102896 ↗
2. 10.1007/s40820-020-00453-x10.1007/s40820-020-00453-x ↗
3. 10.3762/bjnano.14.810.3762/bjnano.14.8 ↗
4. 10.1016/j.apmt.2022.10160510.1016/j.apmt.2022.101605 ↗
5. 10.1016/j.nantod.2021.10117010.1016/j.nantod.2021.101170 ↗
6. 10.1002/adfm.20160325410.1002/adfm.201603254 ↗
7. 10.1002/adma.20220216410.1002/adma.202202164 ↗
8. 10.1002/adma.20170032610.1002/adma.201700326 ↗
9. 10.1038/s41565-018-0134-y10.1038/s41565-018-0134-y ↗
10. 10.1007/s40843-021-1974-710.1007/s40843-021-1974-7 ↗
11. 10.1038/s42004-019-0166-810.1038/s42004-019-0166-8 ↗
12. 10.1021/acsnano.7b0312910.1021/acsnano.7b03129 ↗
13. 10.1016/j.jallcom.2017.11.14010.1016/j.jallcom.2017.11.140 ↗
14. 10.1039/b819006b10.1039/b819006b ↗
15. 10.1016/j.ceramint.2022.06.31710.1016/j.ceramint.2022.06.317 ↗
16. 10.1016/j.nano.2008.07.00510.1016/j.nano.2008.07.005 ↗
17. 10.1016/j.mtadv.2021.10018110.1016/j.mtadv.2021.100181 ↗
18. 10.1007/s12274-018-2252-010.1007/s12274-018-2252-0 ↗
19. 10.1021/nn301675f10.1021/nn301675f ↗
20. 10.1111/j.1551-2916.2004.00050.x10.1111/j.1551-2916.2004.00050.x ↗
21. Chen · Chinese Journal of Physics (Amsterdam, Netherlands) · 1994 · 32 · 205
22. 10.1557/jmr.1996.018210.1557/jmr.1996.0182 ↗
23. 10.1016/j.surfcoat.2011.05.00410.1016/j.surfcoat.2011.05.004 ↗
24. 10.1016/j.apsusc.2015.08.08610.1016/j.apsusc.2015.08.086 ↗
25. 10.1016/j.jallcom.2005.11.01710.1016/j.jallcom.2005.11.017 ↗
26. 10.1017/s143192760999120610.1017/s1431927609991206 ↗