journal article·1993-05

YBaCuO thin films deposited by ion beam sputtering assisted by implantation of: O, Ne, Ar, Cu, Kr, Xe and Ba

R.J. Gaboriaud, E. Salmon, S. Benayoun

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Metal and Thin Film Mechanics · Copper Interconnects and Reliability · Ion-surface interactions and analysis

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References (15)

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