journal article·1999-05

Dependence of oxygen precipitate size and strain on external stress at annealing of Cz-Si

I.V Antonova, A Misiuk, J Bak-Misiuk, V.P Popov, A.E Plotnikov, B Surma

Journal of Alloys and Compounds· Volume 286· Issue 1-2
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Silicon and Solar Cell Technologies · Thin-Film Transistor Technologies · Integrated Circuits and Semiconductor Failure Analysis

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References (7)

Show source-provided references
1. Borghesi · J. Appl. Phys. · 1995 · 77 · 416910.1063/1.359479 ↗
2. Joly · Semicond. Sci. Technol. · 1994 · 9 · 10510.1088/0268-1242/9/1/019 ↗
3. Misiuk · Solid State Phenom. · 1991 · 19/20 · 38710.4028/www.scientific.net/SSP.19-20.387 ↗
4. Misiuk · Phys. Status Solidi (b) · 1996 · 198 · 56510.1002/pssb.2221980176 ↗
5. Jung · Philos. Mag. A · 1984 · 50 · 23310.1080/01418618408244225 ↗
6. Misiuk · Electrochem. Soc. Proc. · 1995 · 95–30 · 194
7. Antonova · Physica B · 1996 · 225 · 25110.1016/0921-4526(96)00264-5 ↗