Mössbauer and adhesion study of ion beam-modified Fe-PTFE interfaces
Source abstract
Abstract
Abstract Conversion electron Mössbauer spectroscopy was used to study ion beam-induced effects at Fe-PTFE thin film interfaces and to relate these effects to accompanying modifications in adhesion. Irradiation with 16 MeV 32S3+ ions to doses ranging from 5 x 1011 to 2 × 1014 ions/cm2 was carried out before or after deposition of thin 57Fe layers. For both pre- and post-bombardment, a substantial adhesion enhancement was observed. Associated with this were significant changes in the Mössbauer spectra indicating the formation of Fe-C and Fe-F compounds. This compound formation can be associated with the observed improvement in thin film adhesion. Keywords: Mössbauer spectroscopyadhesionMeV ionsthin filmsinterfacessticking
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Research context
OpenAlex topics: Diamond and Carbon-based Materials Research · Metal and Thin Film Mechanics · Ion-surface interactions and analysis
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References (6)
Show source-provided references
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