The interrelationships between electronically conductive adhesive formulations, substrate and filler surface properties, and joint performance. Part II: the effects of bonding pressure
Source abstract
Abstract
Abstract Electronically conductive adhesives (ECAs) have received a great deal of attention in recent years for interconnection applications. Even though ECAs have excellent potential for being efficient and less costly alternative to solder joining in electronic components, they still suffer from a number of problems relative to durability and design to meet specific needs. These include issues with the formulations of the conductive adhesive and its interactions with the substrate surface. In order to study these problems, we prepared two different adherends varying in surface characteristics and bonded them with three different conductive adhesive formulations with varying particle loadings, shapes and sizes of conductive nickel fillers. Joints were also prepared with two different adhesive thicknesses, and the effects were discussed in Part I of this paper. This part discusses the effects of filler surface properties, volume fraction and bonding under different levels of pressure to gain insight into the influence of these parameters on the joint strength, deformation and joint conductivity. Our results showed that chemical etching of particles, which changes the shape of the particles, has a profound effect on the joint strength, deformation and electrical conduction behavior. We note that prolonged period of chemical etching of spherical Ni-110 particles with hydrochloric acid causes irregularities in the shape of the nickel particles, and an increase of 60% in the joint resistance. Higher bonding pressure generally resulted in lower failure load and ultimate displacement values, indicating the possibility of squeeze flow for the neat resin under high pressure. Incorporation of larger particles in the adhesive formulation yielded a more efficient resin squeeze mechanism. Keywords: ELECTRONICALLY CONDUCTIVE ADHESIVESADHESIVE FORMULATIONSADHESIVE THICKNESSSUBSTRATE SURFACE PROPERTIESBONDING PRESSURECONDUCTIVE JOINT PERFORMANCENICKEL FILLERSCHEMICAL ETCHINGSURFACE ROUGHNESSFILLER VOLUME FRACTION
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Research context
OpenAlex topics: Electronic Packaging and Soldering Technologies · 3D IC and TSV technologies · Adhesion, Friction, and Surface Interactions
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (25)
Show source-provided references
1. Kang, S. K. and Purushothaman, S. 1998.Proc. 48th IEEE Electronic Components and Technology Conference103110.1109/ECTC.1998.678840 ↗
2. 10.1163/156856199X0093810.1163/156856199X00938 ↗
3. 10.1163/156856196X0020110.1163/156856196X00201 ↗
4. Darwish S. M. · Int. J. Adhesion Adhesives · 1989 · 9 · 22410.1016/0143-7496(89)90065-1 ↗
5. Radford K. C. · J. Mater. Sci. · 1971 · 6 · 128610.1007/BF00552042 ↗
6. Ebewele R. O. · J. Appl. Polym. Sci. · 1986 · 31 · 227510.1002/app.1986.070310726 ↗
7. Constable, J. H., Kache, T., Tiechmann, H., Muhle, S. and Gaynes, M. A. 1998.Proceedings of the 3rd International Conference on Adhesive Joining and Coating Technology in Electronic Manufacturing76Binghamton, NY10.1109/ADHES.1998.742006 ↗
8. 10.1163/15685610174334610.1163/156856101743346 ↗
9. Kilik R. · Int. J. Adhesion Adhesives · 1989 · 9 · 22410.1016/0143-7496(89)90065-1 ↗
10. Sancaktar E. · J. Adhesion · 1996 · 56 · 22910.1080/00218469608010510 ↗
11. Yamashita M. · J. Mater. Sci. Lett. · 2003 · 22 · 131110.1023/A:1025766723541 ↗
12. Liu J. · J. Electr. Manufact. · 1993 · 3 · 20510.1142/S096031319300022X ↗
13. Bustos C. · Forest Prod. J. · 2003 · 53 · 85
14. Seppala A. · Sold. Surf. Mount Technol. · 2003 · 15 · 1610.1108/09540910310455671 ↗
15. Seppala A. · Int. J. Microcircuits Electr. Pack. · 2001 · 24 · 148
16. Wu Y. P. · Microelectr. Reliabil. · 2004 · 44 · 29510.1016/S0026-2714(03)00214-2 ↗
17. Fan S. H. · J. Electr. Mater. · 2003 · 32 · 10110.1007/s11664-003-0243-7 ↗
18. Chan Y. C. · Microelectr. Reliabil. · 2002 · 42 · 119510.1016/S0026-2714(02)00089-6 ↗
19. Chang S. M. · Microelectr. Reliabil. · 2001 · 41 · 200110.1016/S0026-2714(01)00221-9 ↗
20. Yim M. J. · IEEE Trans. Adv. Packag. · 1999 · 22 · 16610.1109/6040.763188 ↗
21. Gaynes, M., Kodnani, R., Pierson, M., Hoontrakul, P. and Paquette, M. 1998.Proceedings of the 3rd International Conference on Adhesive Joining and Coating Technology in Electronics Manufacturing244Binghamton, NY10.1109/ADHES.1998.742034 ↗
22. Jokinen, E. and Ristolainen, E. 2001.Proceedings 2001 International Symposium on Microelectronics600Baltimore, MD
23. Vuorela, M. and Kivilahti, J. K. 2001.Proc. First International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics. Incorporating POLY, PEP and Adhesives in Electronics202Potsdam, Germany10.1109/POLYTR.2001.973280 ↗
24. Zonghe L. · IEEE Trans. Compon. Packag. Manuf. Technol., Part B: Adv. Packag. · 1996 · 19 · 64410.1109/96.533908 ↗
25. Gomatam R. · J. Adhesion Sci. Technol. · 2004 · 18 · 1235