Atomic Force Microscope Techniques for Adhesion Measurements

Abstract The Atomic Force Microscope (AFM) has become a powerful apparatus for performing real-time, quantitative force measurements between materials. Recently the AFM has been used to measure adhesive interactions between probes placed on the AFM cantilever and sample surfaces. This article reviews progress in this area of adhesion measurement, and describes a new technique (Jump Mode) for obtaining adhesion maps of surfaces. Jump mode has the advantage of producing fast, quantitative adhesion maps with minimal memory usage.