Infrared Reflection Spectroscopy of Polycyanurate Thin Films on Solids–State of the Interphase

FTIR reflection spectroscopy was used to characterize thin films of a cyanurate prepolymer on evaporated aluminium and on silicon single crystal wafers. Both substrates are covered by their native oxides. The optical function of the prepolymer is derived from ATR measurements. The measured thin film reflectance spectra have to be interpreted in comparison with the corresponding bulk spectra obtained by simulation. All samples re-produce the bulk composition. The cyanate groups of the prepolymer are not involved in specific intermolecular interactions or in preferential orientation. This is also found for the triazine rings on Si. On Al, however, a considerable excess of triazine rings are oriented parallel to the interface. The vibration frequencies of the triazine groupings that are perpendicular to the Al substrate show a red shift to some 2–8 c−1. This special interaction effect does not occur on Si. Both the preferential orientation and the specific inter-molecular interaction act at least 100 nm into the prepolymer layer.