Optical and structural properties and surface tension of uranium oxide thin film

During this study, uranium oxide thin film is deposited by chemical bath deposition method. The structure of the films is analysed by far-infrared spectrum, X-ray diffraction. The average grain size is determined to be 22.93 nm. The film thickness is measured with atomic force microscopy, at 280 nm. The optical properties are researched through ultraviolet-visible spectroscopic technique. Well-known optical properties of uranium oxide thin film are compared with the related data in literature and unknown optical properties of uranium oxide thin film are researched. The transmittance is found to be 83.75% at 550 nm wavelengths and the refractive index is found to be 1.56 at 550 nm wavelengths. The uranium oxide thin film was a transparent thin film. The optical band gap of the uranium oxide thin film is graphically estimated to be 1.45 eV. The surface tension of uranium oxide thin film is calculated to be 33.33 mN/m.