journal article·2026-07-06Open access

Alignment of Electron Gun for X-Ray Photoelectron Spectroscopy Using a Faraday Cup with Two Sharp Tungsten Edges

Geng Niu, Yanli Li, Pengfei Wang, Hui Tong, Junbiao Liu, Huibin Zhao, Zhuang Xu, Li Han

Applied Sciences· Volume 16· Issue 13

Abstract

The electron gun is a critical component of the X-ray source in X-ray photoelectron spectroscopy (XPS) systems, responsible for generating and directing an electron beam to the target from which X-rays emit. Precise alignment of the electron gun is fundamental for XPS analysis because misalignment can lead to electron beam position shift and reduce signal intensity when the objective lens current (OLC) changes slightly. This work proposes a new electron beam gun alignment method utilizing a Faraday cup fitted with two sharp tungsten edges. Following mechanical alignment, the electrical alignment parameters are optimized incrementally, while the corresponding positions and shapes of beam spots at different OLCs are measured concurrently. The electron beam alignment is considered completed when all the measured beam spots maintain a consistent center position and exhibit regular circular shapes. Employing this method, precise alignment of the electron gun can be accomplished in two types of scenarios: when the beam spot is about 52 μm or 8 μm. The alignment is also verified by a series of images captured by a camera when the electron beam bombards tungsten. This is a promising alignment method for other electron or ion guns with a similar beam size.
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Crystallography and Radiation Phenomena · X-ray Spectroscopy and Fluorescence Analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing 100190, China

School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

References (27)

Show source-provided references
1. XPS depth profiling of functional materials: Applications of ion beam etching techniques10.1039/D3QM01036H ↗
2. In situ irradiated XPS investigation on S-scheme TiO2/Bi2S3 photocatalyst with high interfacial charge separation for highly efficient photothermal catalytic CO2 reduction10.1016/j.jmst.2023.11.065 ↗
3. Designing Surface Coating Strategies with Tungsten on Single Crystal NMC Materials by XPS10.1002/aenm.202503051 ↗
4. In situ XPS demonstrated efficient charge transfer of ohmic junctions based on graphdiyne (g-CnH2n-2) nanosheets coupled with porous nanoflowers Ni5P4 for efficient photocatalytic H2 evolution10.1016/j.carbon.2023.118752 ↗
5. Enhancement of hydrogen evolution activity by tailoring the electronic structure in ruthenium-heteroatom-doped cobalt iron phosphide nanoframes10.1016/j.apcatb.2023.123327 ↗
6. X-ray photoelectron spectroscopy: Progress and perspectives10.1016/j.elspec.2010.01.006 ↗
7. X-ray photoelectron spectroscopy insights into interfacial degradation pathways of halide based all-solid-state batteries: A review10.1016/j.cej.2025.171135 ↗
8. Andrade, J.D. (1985). X-Ray Photoelectron Spectroscopy (XPS), Plenum Press.10.1007/978-1-4684-8610-0_5 ↗
9. Aziz, M., and Ismail, A.F. (2019). X-Ray Photoelectron Spectroscopy (XPS), Springer.
10. Khan, M.M. (2025). X-Ray Photoelectron Spectroscopy, Elsevier.
11. Mitigating charging in NAP-XPS: A practical approach for insulating catalyst powders10.1016/j.apsusc.2026.166756 ↗
12. Voltage contrast inspection of an electrical defect on a semiconductor wafer with X-ray photoelectron spectroscopy and an electron beam10.1016/j.apsusc.2025.162336 ↗
13. Measurement of X-ray absorption spectra (XAS) of insulators by the partial electron yield method using an electron flood gun10.1016/S0368-2048(00)00338-8 ↗
14. Design and performance testing of an electron gun with high transmission efficiency and high beam density10.1016/j.nimb.2026.166202 ↗
15. Influence of the cathode position on beam current characteristics in the thermionic electron gun10.1007/s41605-022-00335-3 ↗
16. Beam Alignment between Pierce Electron-Gun and Constant Magnetic-Fields
17. Electron Beam Alignment between Pierce Electron Gun and Periodic Magnetic Fields
18. Note: O-ring stack system for electron gun alignment10.1063/1.4905575 ↗
19. Ion Beam Alignment Procedures using a Faraday Cup or a Silicon Dioxide Film on Silicon Substrate with Auger Electron Microscope10.1384/jsa.14.124 ↗
20. Design and evaluation of a novel Faraday cup for easy and accurate beam current measurement in a transmission electron microscope10.1016/j.micron.2025.103873 ↗
21. A Faraday cup for charge measurements in biophysical and environmental fieldwork10.1016/j.elstat.2025.104062 ↗
22. Simulation Of Ion Beam Interaction of Plasma Focus Device With The Inner Surface Of Faraday Cup
23. Development of a high-voltage power supply with ultra-low ripple of beam current on electron beam gun10.1063/5.0230002 ↗
24. Experimental methods in chemical engineering: Scanning electron microscopy and X-ray ultra-microscopy-SEM and XuM10.1002/cjce.24405 ↗
25. Multimode objective lens for momentum microscopy and X-ray photoemission electron microscopy: Experiments10.1063/5.0311293 ↗
26. Square beams for optimal tiling in transmission electron microscopy10.1038/s41592-023-02161-x ↗
27. Terahertz control and timing correlations in a transmission electron microscope10.1126/sciadv.adl6543 ↗