In Situ Monitoring of Lithium Battery Separator by Low-Voltage Scanning Electron Microscopy
Source abstract
Abstract
Scanning electron microscopy (SEM) is a popular surface characterization technique. However, SEM observation and measurement of nonconducting soft materials still suffer from the charge effect and beam damage caused by high landing energy. In this work, a low-voltage SEM (LVSEM) was employed to directly observe and record the in situ beam damage of nonconducting polymer films. A series of unprecedented high-quality surface structure images of the nonconducting materials was obtained by controlling the landing energy of the incident electron beam.
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Electrohydrodynamics and Fluid Dynamics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Research Institute of Tsinghua University in Shenzhen, Shenzhen 518057, China
National Laboratory of Solid State Microstructures, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Science and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China
Carl Zeiss (Shanghai) Co., Ltd., Shanghai 200131, China
Hitachi High-Tech (Shanghai) Co., Ltd., Shanghai 201203, China
Hefei Guojing Instrument Technology Co., Ltd., Hefei 230061, China
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