Methods of designing electrical equipment for testing very large scale integrated circuit
Source abstract
Abstract
Due to the constant increase in the level of integration of modern integrated circuits, more stringent requirements are imposed not only on the effectiveness of the methods of their functional cont...
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Sensor Technology and Measurement Systems · Experimental Learning in Engineering · Advanced Electrical Measurement Techniques
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References
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