Analysis of Three-Dimensional Micro-Contact Morphology of Contact Groups Based on Superpixel AMR Morphological Features and Fractal Theory

At the microscale, the three-dimensional morphological features of contact surfaces have a significant impact on the performance of electrical contacts. This paper aims to reconstruct the microscopic contact state of contact groups and to deeply study the effect of contact morphological features on electrical contact performance. To fully obtain multimodal data such as the three-dimensional micro-morphological features and chemical composition distribution of contact surfaces, this paper proposes a contact surface feature-matching method based on entropy rate superpixel seed point adaptive morphological reconstruction. This method can adaptively retain meaningful seed points while filtering out invalid seed points, effectively solving the problem of over-segmentation in traditional superpixel segmentation method. Experimental results show that the proposed method achieves a segmentation accuracy of 92% and reduces over-segmentation by 30% compared to traditional methods. Subsequently, on the basis of the moving and static contact group difference plane model and the W-M model, this paper constructs a three-dimensional surface fractal contact model with an irregular base. This model has the ability to layer simulate multi-parameter elastic and plastic and to extract fractal parameter point cloud height, which can more accurately reflect the actual contact state of the contact group. The model demonstrates a 15% improvement in contact area prediction accuracy and a 20% reduction in contact resistance estimation error compared to existing models. Finally, this paper compares and verifies the theoretical feasibility of the model, providing a new theoretical contact model for the study of the impact of three-dimensional micro-morphology on the electrical contact reliability.