Foreword to the Special Issue on Terahertz Nondestructive Testing
Source abstract
Abstract
It is my pleasure to introduce this Special Issue on “Terahertz Nondestructive Testing”, one of the most promising new technologies to be applied to non-destructive inspection problems [...]
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short
Research context
OpenAlex topics: Terahertz technology and applications · Semiconductor Quantum Structures and Devices · Photonic and Optical Devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department Mechanical Engineering, University of Bristol, Bristol BS8 1TH, UK
UK Research Centre in NDE (RCNDE), Glasgow G61 4AL, UK
The British Institute of Non-Destructive Testing (BINDT), Northampton NN1 5NX, UK
References (7)
Show source-provided references
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4. Reference-free THz-TDS conductivity analysis of thin conducting films10.1364/OE.402447 ↗
5. Tao, Y.H., Fitzgerald, A.J., and Wallace, V.P. (2020). Non-contact, non-destructive testing in various industrial sectors with terahertz technology. Sensors, 20.10.3390/s20030712 ↗
6. Semiconductor-based terahertz photonics for industrial applications10.1109/JLT.2017.2786260 ↗
7. Naftaly, M., Vieweg, N., and Deninger, A. (2019). Industrial applications of terahertz sensing: State of play. Sensors, 19.10.3390/s19194203 ↗