Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress
Source abstract
Abstract
Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device.
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Research context
OpenAlex topics: Organic Light-Emitting Diodes Research · Organic Electronics and Photovoltaics · Thin-Film Transistor Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Bionanotechnology, ERICA Campus, Hanyang University, Ansan 15588, Gyeonggi-do, Korea
OLED Technology Quality Reliability, Samsung Display, Asan 31454, Chungcheongnam-do, Korea
Department of Photonics and Nanoelectronics and BK21 FOUR ERICA-ACE Center, ERICA Campus, Hanyang University, Ansan 15588, Gyeonggi-do, Korea
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