Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. Appl. Sci. 2020, 10, 6819
Source abstract
Abstract
The authors wish to make the following corrections to this paper [...]
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Source: crossref · Quality: short
Research context
OpenAlex topics: Thermography and Photoacoustic Techniques · Calibration and Measurement Techniques · Industrial Vision Systems and Defect Detection
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Affiliations
Computer Vision and Systems Laboratory, Department of Electrical and Computer Engineering, Université Laval, av de la Médecine, Québec, QC 1065, Canada
References (1)
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1. Fang, Q., and Maldague, X. (2020). A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. Appl. Sci., 10.10.20944/preprints202008.0565.v1 ↗