Selection of Optimal Path Control Algorithms for Probe Heads Used on Five-Axis Measuring Systems
Source abstract
Abstract
The utilization of rotational movements of a probing system during points measurementscontributes to the reduction of measurement duration and increases measurement repeatability.However, knowledge on such behavior and accuracy of probing systems is still unsatisfactory.Machines combined with articulating probing systems that have the ability of continuous indexationbecome redundant systems, which means that the same points can be measured using almost infinitemutual configurations of the machine and probe stylus orientations. Therefore, the proper selectionof inspection path planning method becomes one of the main factors affecting the accuracy of themeasurement. It is possible to assess the impact of this factor on the accuracy of the measurementby comparing the results of the measurements of gauge elements, which are done using differentpath controlling algorithms. After that, the best method for basic measuring tasks can be chosenin order to reduce measurement errors. Measurements of the multi-feature check gauge, using thedefault method for path planning and those chosen on the basis of described experiments, indicatesthat the improvement of accuracy may reach several microns. Results presented in this paper can bedirectly transferred to similar systems and measuring tasks, which are commonly met in industrialand scientific practice.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Advanced Measurement and Metrology Techniques · Advanced Surface Polishing Techniques · Optical measurement and interference techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Laboratory of Coordinate Metrology, Cracow University of Technology, 31-155 Kraków, Poland
Funding
Narodowe Centrum Nauki
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