Three-Dimension Resolution Enhanced Microscopy Based on Parallel Detection
Source abstract
Abstract
Pixel reassignment image scanning microscopy (PRISM) is a useful tool to improve the resolution of confocal laser scanning microscopy (CLSM) only equipped with a detector array. However, while it can improve the lateral resolution, it has little effect on the axial resolution. Here, new microscopy has been proposed which combines three-dimension fluorescence emission difference microscopy (3D FED) with PRISM to further improve three-dimension resolution. We call this method three-dimension pixel reassignment fluorescence emission difference microscopy (3D-PRFED). Detailed theoretical analysis and simulation are presented in this paper. Additionally, the performance of lateral and axial resolution improvement of this method has been demonstrated by imaging 100 nm fluorescent beads and nuclear pore complexes samples. Experiment results show that this method in our system can improve lateral resolution by a factor of 1.85 and axial resolution by a factor of 1.48 compared with CLSM.
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Research context
OpenAlex topics: Advanced Fluorescence Microscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Near-Field Optical Microscopy
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027, China
Ningbo Research Institute, Zhejiang University, Ningbo 315100, China
Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006, China
Funding
National Natural Science Foundation of China · Major Program of the Natural Science Foundation of Zhejiang Province · Key Research and Development Program of Zhejiang Province · Fundamental Research Funds for the Central Universities · Zhejiang Lab
References (25)
Show source-provided references
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