A Calibration Method for System Parameters in Direct Phase Measuring Deflectometry
Source abstract
Abstract
Phase measuring deflectometry has been widely studied as a way of obtaining the three-dimensional shape of specular objects. Recently, a new direct phase measuring deflectometry technique has been developed to measure the three-dimensional shape of specular objects that have discontinuous and/or isolated surfaces. However, accurate calibration of the system parameters is an important step in direct phase measuring deflectometry. This paper proposes a new calibration method that uses phase information to obtain the system parameters. Phase data are used to accurately calibrate the relative orientation of two liquid crystal display screens in a camera coordinate system, by generating and displaying horizontal and vertical sinusoidal fringe patterns on the two screens. The results of the experiments with an artificial specular step and a concave mirror showed that the proposed calibration method can build a highly accurate relationship between the absolute phase map and the depth data.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Optical measurement and interference techniques · Image Processing Techniques and Applications · Advanced Vision and Imaging
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin 300130, China
School of Mechanical Engineering, Heibei University of Technology, Tianjin 300130, China
References (47)
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