Self-Referenced Spectral Interferometry for Femtosecond Pulse Characterization
Source abstract
Abstract
Since its introduction in 2010, self-referenced spectral interferometry (SRSI) has turned out to be an analytical, sensitive, accurate, and fast method for characterizing the temporal profile of femtosecond pulses. We review the underlying principle and the recent progress in the field of SRSI. We present our experimental work on this method, including the development of self-diffraction (SD) effect-based SRSI (SD-SRSI) and transient-grating (TG) effect-based SRSI (TG-SRSI). Three experiments based on TG-SRSI were performed: (1) We built a simple TG-SRSI device and used it to characterize a sub-10 fs pulse with a center wavelength of 1.8 μm. (2) On the basis of the TG effect, we successfully combined SRSI and frequency-resolved optical gating (FROG) into a single device. The device has a broad range of application, because it has the advantages of both SRSI and FROG methods. (3) Weak sub-nanojoule pulses from an oscillator were successfully characterized using the TG-SRSI device, the optical setup of which is smaller than the palm of a hand, making it convenient for use in many applications, including sensor monitoring the pulse profile of laser systems. In addition, the SRSI method was extended for single-shot characterization of the temporal contrast of ultraintense and ultrashort laser pulses.
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Research context
OpenAlex topics: Laser-Matter Interactions and Applications · Advanced Fiber Laser Technologies · Laser Material Processing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
University of Chinese Academy of Sciences, Beijing 100049, China
Collaborative Innovation Center of IFSA (CICIFSA), Shanghai Jiao Tong University, Shanghai 200240, China
Advanced Ultrafast Laser Research Center, the University of Electro-Communications, 1-5-1, Chofugaoka, Chofu, Tokyo 182-8585, Japan
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