A Novel High-Precision Imaging Radar for Quality Inspection of Building Insulation Layers
Source abstract
Abstract
In recent years, the building insulation layer peeling caused by quality problems has brought about safety hazards to human life. Existing means of non-destructive testing of building insulation layers, including laser scanning, infrared thermal imaging, ultrasonic testing, acoustic emission, ground-penetrating radar, etc., are unable to simultaneously guarantee the detection depth and resolution of the insulation layer defects, not to mention high-precision imaging of the insulation layer structure. A new type of high-precision imaging radar is specifically designed for the quantitative quality inspection of external building insulation layers in this paper. The center frequency of the radar is 8800 MHz and the −10 dB bandwidth is 3100 MHz, which means it can penetrate the insulated panel not less than 48.4 mm thick and catch the reflected wave from the upper surface of the bonding mortar. When the bonding mortar is 120 mm away from the radar, the radar can achieve a lateral resolution of about 45 mm (capable of distinguishing two parties of bonding mortar with a 45 mm gap). Furthermore, an ultra-wideband high-bunching antenna is designed in this paper combining the lens and the sinusoidal antenna, taking into account the advantages of high directivity and ultra-wideband. Finally, the high-precision imaging of data collected from multiple survey lines can visually reveal the distribution of bonded mortar and the bonding area. This helps determine whether the bonding area meets construction standards and provides data support for evaluating the quality of the insulation layer.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Geophysical Methods and Applications · Microwave Imaging and Scattering Analysis · Seismic Waves and Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
College of Geo-Exploration Science and Technology, Jilin University, Changchun 130026, China
The 22nd Research Institute of the China Electronics Technology Group Corporation, Qingdao 266107, China
References (36)
Show source-provided references
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