journal article·2025-08-17Open access

Feature Fusion Using Deep Learning Algorithms in Image Classification for Security Purposes by Random Weight Network

Mustafa Servet Kiran, Gokhan Seyfi, Merve Yilmaz, Engin Esme, Xizhao Wang

Applied Sciences· Volume 15· Issue 16

Abstract

Automated threat detection in X-ray security imagery is a critical yet challenging task, where conventional deep learning models often struggle with low accuracy and overfitting. This study addresses these limitations by introducing a novel framework based on feature fusion. The proposed method extracts features from multiple and diverse deep learning architectures and classifies them using a Random Weight Network (RWN), whose hyperparameters are optimized for maximum performance. The results show substantial improvements at each stage: while the best standalone deep learning model achieved a test accuracy of 83.55%, applying the RWN to a single feature set increased accuracy to 94.82%. Notably, the proposed feature fusion framework achieved a state-of-the-art test accuracy of 97.44%. These findings demonstrate that a modular approach combining multi-model feature fusion with an efficient classifier is a highly effective strategy for improving the accuracy and generalization capability of automated threat detection systems.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Machine Learning and ELM · Face and Expression Recognition · Brain Tumor Detection and Classification

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Computer Engineering, Faculty of Computer and Information Sciences, Konya Technical University, Konya 42250, Türkiye

Department of Software Engineering, Faculty of Engineering and Natural Sciences, Gümüşhane University, Gümüşhane 29100, Türkiye

Department of Software Engineering, Faculty of Computer and Information Sciences, Konya Technical University, Konya 42250, Türkiye

College of Computer Science and Software Engineering, Shenzhen University, Shenzhen 518060, China

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