An Easy Technique for Focus Characterization and Optimization of XUV and Soft X-ray Pulses
Source abstract
Abstract
For many applications of extreme ultraviolet (XUV) and X-ray pulses, a small focus size is crucial to reach the required intensity or spatial resolution. In this article, we present a simple way to characterize an XUV focus with a resolution of 1.85 µm. Furthermore, this technique was applied for the measurement and optimization of the focus of an ellipsoidal mirror for photon energies ranging from 18 to 150 eV generated by high-order harmonics. We envisage a broad range of applications of this approach with sub-micrometer resolution from high-harmonic sources via synchrotrons to free-electron lasers.
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Research context
OpenAlex topics: Advanced X-ray Imaging Techniques · Laser-Matter Interactions and Applications · Laser-Plasma Interactions and Diagnostics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Physics, Umeå University, SE-90187 Umeå, Sweden
Ultrafast Optics Group, School of Pure and Applied Physics, Mahatma Gandhi University, Kottayam 686560, Kerala, India
Funding
the Swedish Research Council, Vetenskapsrådet · Knut och Alice Wallenberg Stiftelse · Kempestiftelserna
References (29)
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