Double-confined phase-change heterostructure memory for ultra-stable low-power multi-level operation

Abstract Phase change heterostructures (PCHs) have emerged as effective solutions to mitigate atomic diffusion in phase change random access memory (PCRAM). Atomic diffusion often leads to structural instability, while rapid phase transitions hinder reliable multi-level operation during the RESET process. These limitations pose significant challenges for scalability and performance in advanced memory technologies. To address these issues, this study presents a double-confined PCH device that incorporates Sb ₂ Te ₃ as the phase change material and NiTe ₂ and MoTe ₂ as confinement layers. This innovative architecture precisely controls amorphous region formation through confined heat diffusion, enabling accurate resistance tuning, rapid multi-level switching, and ultra-low power consumption. The NiTe ₂ and MoTe ₂ layers effectively regulate heat conduction and confinement, minimizing thermal cross-talk and enhancing structural stability during operation. Compared with conventional PCH devices, the proposed design achieves a 110% increase in durability, a 76% reduction in power consumption, and robust multi-level operational capability. These advancements represent a significant step forward in enhancing the overall performance and reliability of PCRAM technologies. Furthermore, the proposed device holds promise for high-density memory integration in next-generation computing systems, addressing the growing demand for scalable and energy-efficient memory solutions.