journal article·2001-07

Influence of Microstructure Coarsening on Thermomechanical Fatigue Behavior of Pb/Sn Eutectic Solder Joints

Hong Tang, Cemal Basaran

Publisher page

Abstract

The influence of microstructure coarsening on thermomechanical fatigue behavior of eutectic solder joint is investigated by numerical simulation. A phase growth model is selected based on the experimental observation and incorporated in a damage mechanics based viscoplastic constitutive model. Comparisons between the simulations with and without coarsening effect are made for isothermal, cyclic shear testing and thermal cycling of solder joints in BGA electronic packaging.
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Research context

OpenAlex topics: Electronic Packaging and Soldering Technologies · Metal Forming Simulation Techniques · Metallurgy and Material Forming

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Affiliations

Electronic Packaging Laboratory, 243 Ketter Hall, University at Buffalo, Buffalo, NY 14222-1095

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