journal article·2020-11-02Open access

A Data Augmentation Method for Deep Learning Based on Multi-Degree of Freedom (DOF) Automatic Image Acquisition

Liangliang Chen, Ning Yan, Hongmai Yang, Linlin Zhu, Zongwei Zheng, Xudong Yang, Xiaodong Zhang

Applied Sciences· Volume 10· Issue 21

Abstract

Deep learning technology is outstanding in visual inspection. However, in actual industrial production, the use of deep learning technology for visual inspection requires a large number of training data with different acquisition scenarios. At present, the acquisition of such datasets is very time-consuming and labor-intensive, which limits the further development of deep learning in industrial production. To solve the problem of image data acquisition difficulty in industrial production with deep learning, this paper proposes a data augmentation method for deep learning based on multi-degree of freedom (DOF) automatic image acquisition and designs a multi-DOF automatic image acquisition system for deep learning. By designing random acquisition angles and random illumination conditions, different acquisition scenes in actual production are simulated. By optimizing the image acquisition path, a large number of accurate data can be obtained in a short time. In order to verify the performance of the dataset collected by the system, the fabric is selected as the research object after the system is built, and the dataset comparison experiment is carried out. The dataset comparison experiment confirms that the dataset obtained by the system is rich and close to the real application environment, which solves the problem of dataset insufficient in the application process of deep learning to a certain extent.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Industrial Vision Systems and Defect Detection · Image and Object Detection Techniques · Surface Roughness and Optical Measurements

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

State Key Laboratory of Precision Measuring Technology & Instrumuments, Centre of MicroNano Manufacturing Technology, Tianjin University, Tianjin 300072, China

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