Inductive Imaging of the Concealed Defects with Radio-Frequency Atomic Magnetometers

We explore the capabilities of the radio-frequency atomic magnetometers in the non-destructive detection of concealed defects. We present results from the systematic magnetic inductive measurement of various defect types in an electrically conductive object at different rf field frequencies (0.4–12 kHz) that indicate the presence of an optimum operational frequency of the sensor. The optimum in the frequency dependence of the amplitude/phase contrast for defects under a 0.5–1.5 mm conductive barrier was observed within the 1–2 kHz frequency range. The experiments are performed in the self-compensated configuration that automatically removes the background signal created by the rf field producing object response.