journal article·2018-03-05Open access

Effects of Shot-Peening and Stress Ratio on the Fatigue Crack Propagation of AL 7475-T7351 Specimens

Natália Ferreira, Pedro Antunes, José Ferreira, José D. M. Costa, Carlos Capela

Applied Sciences· Volume 8· Issue 3

Abstract

Shot peening is an attractive technique for fatigue enhanced performance of metallic components, because it increases fatigue crack initiation life prevention and retards early crack growth. Engineering design based on fatigue crack propagation predictions applying the principles of fracture mechanics is commonly used in aluminum structures for aerospace engineering. The main purpose of present work was to analyze the effect of shot peening on the fatigue crack propagation of the 7475 aluminum alloy, under both constant amplitude loading and periodical overload blocks. The tests were performed on 4 and 8 mm thickness specimens with stress ratios of 0.05 and 0.4. The analysis of the shot-peened surface showed a small increase of the micro-hardness values due to the plastic deformations imposed by shot peening. The surface peening beneficial effect on fatigue crack growth is very limited; its main effect is more noticeable near the threshold. The specimen’s thickness only has marginal influence on the crack propagation, in opposite to the stress ratio. Periodic overload blocks of 300 cycles promotes a reduction of the fatigue crack growth rate for both intervals of 7500 and 15,000 cycles.
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Research context

OpenAlex topics: Surface Treatment and Residual Stress · Fatigue and fracture mechanics · High-Velocity Impact and Material Behavior

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Mechanical Engineering, Centre for Mechanical Engineering, Materials and Processes (CEMMPRE), University of Coimbra, Rua Luís Reis Santos, Coimbra 3030-788, Portugal

Department of Mechanical Engineering, Instituto Politécnico de Leiria, ESTG, Morro do Lena—Alto Vieiro, Leiria 2400-901, Portugal

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