Research on Residual Life Prediction for Electrical Connectors Based on Intermittent Failure and Hidden Semi-Markov Model
Source abstract
Abstract
Based on the dynamic properties of electrical connector intermittent failure, the model and methods for residual life prediction for electrical connectors are studied in this paper. Firstly, the mechanism of electrical connector intermittent failure is analyzed, and the area enclosed by the contact resistance curve and the fault threshold is defined as the generalized severity of intermittent failure to describe how severe the electrical connector’s intermittent failure is. Then, the Hidden Semi-Markov Model (HSMM) is introduced to build the residual life prediction model of the electrical connector. Further, the evaluation method of using the state and prediction method for residual life are studied. Finally, by carrying out the residual life prediction test, the effectiveness of the residual life prediction method for electrical connectors based on intermittent failure and HSMM is verified.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Electrical Contact Performance and Analysis · Reliability and Maintenance Optimization · Electronic Packaging and Soldering Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Science and Technology on Integrated Logistics Support Laboratory, College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha 410073, China
Funding
National Key R&D Program of China
References (22)
Show source-provided references
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