journal article·2016-05-16Open access

Reduction of Liquid Bridge Force for 3D Microstructure Measurements

Hiroshi Murakami, Akio Katsuki, Takao Sajima, Mitsuyoshi Fukuda

Applied Sciences· Volume 6· Issue 5

Abstract

Recent years have witnessed an increased demand for a method for precise measurement of the microstructures of mechanical microparts, microelectromechanical systems, micromolds, optical devices, microholes, etc. This paper presents a measurement system for three-dimensional (3D) microstructures that use an optical fiber probe. This probe consists of a stylus shaft with a diameter of 2.5 µm and a glass ball with a diameter of 5 µm attached to the stylus tip. In this study, the measurement system, placed in a vacuum vessel, is constructed suitably to prevent adhesion of the stylus tip to the measured surface caused by the surface force resulting from the van der Waals force, electrostatic force, and liquid bridge force. First, these surface forces are analyzed with the aim of investigating the causes of adhesion. Subsequently, the effects of pressure inside the vacuum vessel on surface forces are evaluated. As a result, it is found that the surface force is 0.13 µN when the pressure inside the vacuum vessel is 350 Pa. This effect is equivalent to a 60% reduction in the surface force in the atmosphere.
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Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Advanced MEMS and NEMS Technologies · Adhesion, Friction, and Surface Interactions

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Mechanical Systems Engineering, Faculty of Environmental Engineering, The University of Kitakyushu, 1-1 Hibikino, Wakamatsu-ku, Kitakyushu, Fukuoka 808-0135, Japan

Department of Mechanical Engineering, Faculty of Engineering, Kyushu University, 744, Motooka, Nishi-ku, Fukuoka 819-0395, Japan

References (19)

Show source-provided references
1. Vibroscanning method for nondestructive measurement of small holes10.1016/S0007-8506(07)62516-5 ↗
2. Study of a micro-roughness probe with ultrasonic sensor10.1016/j.cirp.2008.03.129 ↗
3. Bauza, M.B., Hocken, R.J., Smith, S.T., and Woody, S.C. (2005). Development of a virtual probe tip with an application to high aspect ratio microscale features. Rev. Sci. Instrum., 76.10.1063/1.2052027 ↗
4. A vibrating micro-scale CMM probe for measuring high aspect ratio structures10.1007/s00542-009-0967-2 ↗
5. Development of a measuring method for shape and dimension of micro-components. Modification to the original measuring system, calibration of the probes and the results of dimensional measurements
6. Opto-Tactile sensor for 2D and 3D measurement of small structures on coordinate measuring machines10.1016/S0007-8506(07)62140-4 ↗
7. Fiber deflection probe for small hole metrology10.1016/j.precisioneng.2005.07.004 ↗
8. Development of the nano-probe system based on the laser-trapping technique10.1016/j.cirp.2008.03.016 ↗
9. New concept of a 3D-probing system for micro-components10.1016/j.cirp.2010.03.036 ↗
10. Development of a system for measuring micro hole accuracy using an optical fiber probe10.1299/jamdsm.4.995 ↗
11. Okuyama, K., Masuda, H., and Morooka, S. (1992). Biryushi Kogaku, Ohmsha.
12. Murakami, H., Katsuki, A., Sajima, T., and Suematsu, T. (2014). Study of a vibrating fiber probing system for 3-D micro-structures: Performance improvement. Meas. Sci. Technol., 25.10.1088/0957-0233/25/9/094010 ↗
13. Israelachvili, J.N. (2011). Intermolecular and Surface Forces: Revised Third Edition, Academic Press.
14. Lee, M., Kim, B., Kim, J., and Jhe, W. (2015). Noncontact friction via capillary shear interaction at nanoscale. Nat. Commun., 6.10.1038/ncomms8359 ↗
15. Yongho, S., and Wonho, J. (2008). Atomic force microscopy and spectroscopy. Rep. Prog. Phys., 71.10.1088/0034-4885/71/1/016101 ↗
16. Calibration of effective spring constants of colloidal probes using reference cantilever method
17. Song, Y.P., Wu, S., Xu, L.Y., Zhang, J.M., Dorantes-Gonzalez, D.J., Fu, X., and Hu, X.D. (2015). Calibration of the effective spring constant of ultra-short cantilevers for a high-speed atomic force microscope. Meas. Sci. Technol., 26.10.1088/0957-0233/26/6/065001 ↗
18. Slattery, A.D., Blanch, A.J., Ejov, V., Quinton, J.S., and Gibson, C.T. (2014). Spring constant calibration techniques for next-generation fast-scanning atomic force microscope cantilevers. Nanotechnology, 25.10.1088/0957-4484/25/33/335705 ↗
19. Slattery, A.D., Blanch, A.J., Quinton, J.S., and Gibson, C.T. (2013). Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers. Nanotechnology, 24.10.1088/0957-4484/24/1/015710 ↗